References

Borgani-2014

Intermodulation electrostatic force microscopy for imaging surface photo-voltage Riccardo Borgani, Daniel Forchheimer, Jonas Bergqvist, Per-Anders Thorén, Olle Inganas, and David B. Haviland Applied Physics Letters 105, 143113 (2014); doi: 10.1063/1.4897966 Borgani_2012

Borgani-2017

Background force compensation in dynamic atomic force microscopy. Riccardo Borgani, Per-Anders Thorén, Daniel Forchheimer, Illia Dobryden, Si Mohamed Sah, Per Martin Claesson, David B. Haviland Borgani_2017

Forchheimer-2012

Model-based extraction of material properties in multifrequency atomic force microscopy. Daniel Forchheimer, Daniel Platz, Erik A. Tholén, and David B. Haviland. Phys. Rev. B. 85, 195449 (2012). Forchheimer_2012

Forchheimer-2013

Simultaneous imaging of surface and magnetic forces. Daniel Forchheimer, Daniel Platz, Erik A. Tholén and David B. Haviland. Appl. Phys. Lett. 103, 013114 (2013) Forchheier_2013

Green-2002

Torsional frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope. Christopher P. Green and John E. Sader Jour. Appl. Phys. 92, 6262 (2002).

Haviland-2016

Quantitative force microscopy from a dynamic point of view. David B. Haviland Current Opinion in Colloid & Interface Science 27 74–81 (2016). Haviland_2016

Higgins-2006

Noninvasive determination of optical lever sensitivity in atomic force microscopy. M. J. Higgins, R. Proksch, J. E. Sader, M. Polcik, S. Mc Endoo, J. P. Cleveland and S. P. Jarvis. Rev. Sci. Instr. 77, 013701 (2006).

Platz-2012a

The role of nonlinear dynamics in quantitative atomic force microscopy. D. Platz, D. Forchheimer, E. A. Tholén and D. B. Haviland. Nanotechnology 23, 265705 (2012). Platz_2012a

Platz-2012b

Interaction imaging with amplitude-dependence force spectroscopy. Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland. Nature Commu. 4, 1360 (2012). doi:10.1038/ncoms2365 Platz_2012b

Platz-2013a

Interpreting force and motion for narrow-band intermodulation atomic force microscopy. Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland. Beilstein J. Nanotechnol. 4, 45 (2013). Platz_2013a

Platz-2013b

Polynomial force approximations and multifrequency atomic force microscopy. Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland. Beilstein J. Nanotechnol. 4, 352 (2013). Platz_2013b

Sader-1998

Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope. J. E. Sader. Jour. Appl. Phys. 84, 64 (1998).

Sader-2005

General scaling law for stiffness measurement of small bodies with applications to the atomic force microscope. J. E. Sader et al. Jour. Appl. Phys. 97, 124903 (2005).

Sader-2012

Spring constant calibration of atomic force microscope cantilevers of arbitrary shape. J. E. Sader et al. Rev. Sci Instr. 83 103705 (2012).

Tholen-2011

The intermodulation lockin analyzer. E. A. Tholen, D. Platz, D. Forchheimer, V. Schuler, M. O. Tholén, C. Hutter and D. B. Haviland. Rev. Sci. Instr. 82, 026109 (2011). Tholen_2011

Thoren-2017

Calibrating torsional eigenmodes of micro cantilevers for dynamic measurement of frictional forces. P.-A. Thorén et al. to be published 2017